TUZ / 2026 POTSDAM / 22.-24.02.2026

38. ITG / GMM / GI - Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen

/// ABOUT

The workshop “Test Methods and Reliability of Circuits and Systems” is the most important german forum for discussing trends, results and current problems in the field of testing, diagnostics and reliability of digital, analog, mixed-signal and RF circuits. The world-wide exchange of ideas is an important concern of the workshop. International contributions from both industrial practice and research institutions are welcome. We welcome highly practice-related experience reports and results as well as contributions on theoretical topics from the following areas, among others:

• adaptive systems (e.g. self-repair, self-healing, self-awareness)
• automatic test-equipment, test automation, test programs and test modeling
• defect- and fault models
• diagnosis of failure causes
• fault tolerance, resilience, robust and raditation-hard systems
• functional safety
• hardware-oriented test and hardware-oriented Security
• statistical and AI-learning for test and reliability
• test and simulation of mixed-signal, HF- and analog-circuit-test
• test generation, fault simulation, selftest and online-test
• test-oriented design, DfT methods
• test costs and quality
• test standards, e.g . IEEE 1149.x, IEEE 1687.x, IEEE 1838

/// CALL FOR PAPER

Here you can find the call for paper to download. Feel free to share it with others that might be interested. For further questions, get in touch with the chairs.

/// PARTICIPATION

The workshop will take place in the beautiful city of Potsdam and is organized by the IHP. The event is planned to be held entirely in person. Interested parties are asked to submit a summary of their contribution of a maximum of two pages via the workshop homepage. The contribution should describe the purpose of the work, the novelty and aspects of the application. Accepted contributions will be included in the informal workshop handout upon request. The contribution can be extended to four pages for this purpose.

/// SUBMISSION PAGE

https://easychair.org/conferences/?conf=tuz2026

/// IMPORTANT DATES

Submission of Title & Abstract / November 9th 2025

Submission of Full Paper / November 16th 2025

Author Notification / December 22nd 2025

Camera-ready Paper / January 18th 2026

/// REGISTRATION

Early Bird registration open until 22.01.2026

VDE-member registration* 375€ / 410€

* discount only with submission of a copy of the VDE/VDI/GI membership card or the student ID/scholarship certificate

Regular full registration 450€ / 500€

Student registration 90€ / 150€

/// PROGRAM COMMITTEE

J. Alt / Infineon Technologies AG /// H. Amrouch / TU München /// B. Becker / University Freiburg /// L. Bolzani Pöhls / IHP /// A. Dalirsami / Bosch /// R. Drechsler / University Bremen and DFKI /// S. Eggersglüss / Siemens EDA /// P. Engelke / Infineon Technologies AG /// G. Fey / TU Hamburg /// S. Hellebrand / University Paderborn /// K. Hofmann / TU Darmstadt /// S. Holst / Kyushu Institute of Technology /// W. Hoppe / Rheinmetall AG /// S. Huhn / Siemens EDA /// M. Kampmann / Siemens EDA /// T. Kilian / Infineon Technologies AG /// R. Krenz-Baath / TH Wildau /// M. Krstic / Uni Potsdam and IHP /// I. Polian / University Stuttgart /// F. Pöhl / Frank Poehl Consulting /// T. Santos Copetti / RWTH Aachen /// S. Sattler / University Erlangen-Nürnberg /// M. Sauer / Advantest Europe GmbH /// M. Schillinsky / NXP Semiconductors Germany GmbH /// H. Schmidt / IBM Deutschland GmbH /// M. Schölzel / Hochschule Nordhausen /// J. Sepulveda / Airbus Defence and Space /// D. Tille / Siemens EDA /// M. Taheri / BTU Cottbus /// T. Wagner / Racyics /// M . Wahl / University Siegen /// H.-J. Wunderlich / University Stuttgart /// F. L. Vargas / IHP

/// CHAIRS

General Chair /// Leticia Maria Bolzani Pöhls / IHP – Leibniz Institut for innovative microelectronics / E-Mail: poehls@ihp-microelectronics.com

Program Chair /// Daniel Tille / Siemens EDA / E-Mail: daniel.tille@siemens.com